11:30 A.M.-12:00 P.M.
Meeting the Test Challenges of 5G (75)
12:00 P.M. - 12:30 P.M.
5G, Millimeter Wave Radios, and ATE (140)
1:30-2:00 p.m.
mmWave(5G) Test Strategy (39)
2:00-2:30 p.m.
Challenges of Over-The-Air Testing at 60 GHz mmWave (8)
2:30-3:00 p.m.
Resolving Dual Tone Test Dilemmas Using an IQ Modulation Methodology (102)
3:00-3:30 p.m.
Expectation and Actual Result of Concurrent Test for SIP Device (117)
4:00 P.M. - 4:30 P.M.
Adaptive RF-DIB for ATE and Bench Reducing NRE-cost and Cycle Time (97)
4:30 P.M. - 5:00 P.M.
J750-LitePoint TTR (13)
5:00 P.M. - 5:30 P.M.
Phase Measurement on Different RF Channels (151)
10:30–11:00 a.m.
Importance of Alarms in Automotive Test (26)
11:00 -11:30 a.m.
ETS-800 Safe Connection Analyzer (71)
11:30 - 12:00 p.m.
ETS800 SPU2112 Sharing Techniques for Applications Requiring >10A (4)
1:00-1:30 p.m.
Accelerating Automotive Testing With UPD-64 (72)
1:30-2:00 p.m.
Low Leakage Measurements: With or Without APU-12? (11)
2:00-2:30 p.m.
Handy Temperature Monitoring For Eagle Test Systems Measurement Resources to Guarantee High Precision Measurement results to Spec (6)
2:30-3:00 p.m.
The Study and Miscorrelation Correction of Signal Reflection on Nanosecond-scale Switching Characteristics Measurements (98)
Visual Studio 2015 Conversion Strategy for ETS Test Applications (146)
11:30 A.M.-12:00 P.M.
Test Method To Detect Solder Voids in a Power Stack QFN Package (150)
12:00 - 12:30 p.m.
Achieving Low Cost Test on High Voltage High Current Industrial eFuse Devices. (143)
1:30-2:00 p.m.
Power Simulation for ETS88TH Load Board Design: Capacitance vs. Inductance (125)
2:00-2:30 p.m.
UHV DIB Design Challenges and Solutions (130)
2:30-3:00 p.m.
Hardware Interface Design Consideration for IPM Devices on ETS-88TH (111)
3:00-3:30 p.m.
Mother Board + AC/DC Socket Board Solution for IGBT Testing on ETS-88TH Platform (123)
4:00 P.M - 4:30 P.M.
ESU Interface Solution on ETS88-TH Platform: Stiffener Interface and Soft-Cable Interface (122)
4:30 P.M. - 5:00 P.M.
Balanced Test Technique for Elimination of Setup Induced Errors in Sensitive High Current Output Measurement Using Eagle 364 Tester (86)
5:00 P.M. - 5:30 P.M.
If You Can't Measure It, You Can't Improve It -- An OEE System for EagleVision MST (144)
10:30–11:00 a.m.
MIPI M-PHY Simulation with IBIS-AMI Model for UFS Signal Integrity Analysis (121)
11:00 -11:30 a.m.
Octal sites 1040MBps Eye Diagram Testing On UP1600 (14)
11:30 - 12:00 p.m.
CDR and TTR Work-arounds on UltraPin1600 (16)
1:00-1:30 p.m.
Extending Walking Strobe and GigaDig Performance By Correcting DIB and Instrument Loss (161)
1:30-2:00 p.m.
US10G Solutions - Jitter Measure/Functional Receive Above 10.7Gbps and Fast CMEM Unpacking (40)
2:00-2:30 p.m.
Addressing 28Gbps SerDes Reference Clock Requirements By Low Jitter Clock Module (9)
2:30-3:00 p.m.
56Gbps PAM4 and RF Together On UltraFLEX (145)
3:30-4:00 p.m.
The Optimal Solution Of Accessing Device Using Register Mirror Method Through PA Module (95)
4:00-4:30 p.m.
How to Deal with DUT Nondeterministic Behavior Using nWire PA (96)
11:30 A.M.-12:00 P.M.
UVS256 Temperature/Current Coefficient Measurements (149)
12:00 - 12:30 p.m.
Power-up Slew Rate Control (21)
1:30 P.M. - 2:00 P.M.
Introduction of Extreme Pure Clock Solution based on LMK04828 (106)
2:00 P.M. -2:30 P.M.
Designing an External Instrument for Smart Phone Quick Charge Applications (128)
2:30 P.M. - 3:00 P.M.
Achieving Force Accuracies Better Than the Published Spec. on VI‘s (153)
3:00 P.M. - 3:30 P.M.
A Generic DIB Diagnostics Solution (89)
4:00 P.M. - 4:30 P.M.
Waveform Analyzer Tool (76)
4:30 P.M. - 5:00 P.M.
IG-Data’s Potential For Dealing With IG-XL Program (94)
5:00 P.M. - 5:30 P.M.
J750 Test Time Analysis With Only A Few Steps - The New Profiler (135)
10:30–11:00 a.m.
Choosing the Right PCB Stackup Technology For Your Teradyne UltraFLEX Test Boards (99)
11:00 -11:30 a.m.
Electrical-Thermal Co-Simulation for Current Capacity in Fine Pitch DIB Design (116)
11:30 - 12:00 p.m.
Novel DIB Layout Solution to Minimize Load Capacitance in pico-Amps Measurement (83)
1:00-1:30 p.m.
The Internet Of Things (IOT) Testing Matters (105)
1:30-2:00 p.m.
MIPI RFFE Testing in Wireless Mobile Devices (108)
2:00-2:30 p.m.
GaN RF Device Trend and GaN Power Amplifier Test Challenges (110)
2:30-3:00 p.m.
5G mmWave RF Testing (107)
3:30-4:00 p.m.
An IGXL Add-Ins for Limit-Sets Function (148)
4:00-4:30 p.m.
An Analysis of Big Difference of SHMOO Between Different ATE (129)
4:30-5:00 p.m.
The Multi-Site Testing Solutions for Display PMIC Device (28)
11:30 A.M.-12:00 P.M.
A Survey of Magnum's User-Installable Hooks (162)
12:00 P.M - 12:30 P.M.
UFS Device Test Solutions Based On Magnum VU System (137)
1:30 P.M. - 2:00 P.M.
Final Test Quality Improvement using Moving Dynamic Part Average Test Limits (64)
2:00 P.M. - 2:30 P.M.
Automated Spike Checker (1)
2:30 P.M. - 3:00 P.M.
Advanced Datalog Tool for Live Data Analysis (12)
4:00 P.M. - 4:30 P.M.
Panel Level Packaging (147)
4:30 P.M. - 5:00 P.M.
What's The Best Probe Technology For My Device? (74)
5:00 - 5:30 p.m.
Test Cost Optimization on Test Insertion Strategies (20)
10:30–11:00 a.m.
Leveraging the Power of the J750 DSIO for a Variety of Applications and Test Time Improvements (36)
11:00 -11:30 a.m.
Virtual Parallel Site: How to Extend the J750 HD Capability To Use the DSIO In Parallel Mode For High Site Count Applications (141)
11:30 - 12:00 p.m.
Capacitor Measurement on J750HD for HDDPS, HDAPMU, HDCTO and HSD800 (65)
1:00-1:30 p.m.
Threshold Test Methods Summary on ETS800 (62)
1:30-2:00 p.m.
Reduction of Application-related Failure at Teradyne FLEX Tester Platform (133)
2:00-2:30 p.m.
Digital Signal Processing vs. Background Processing (156)
2:30-3:00 p.m.
Integration of Universal Robot into Performance Verification Test Process (87)
3:30-4:00 p.m.
Performance and Memory Advantages Of Using 64-bit IG-XL (136)
4:00-4:30 p.m.
How to Setup SSL Local Server License Without Unexpected Happening (119)
4:30-5:00 p.m.
Flexibility and Efficiency of a Centralized Licensing Service (127)